Showing results: 226 - 240 of 314 items found.
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Ono Sokki
This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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NX5000 Series -
Marvin Test Solutions, Inc.
ROM emulation is a powerful and versatile method of microprocessor testing. ROM emulation has emerged as the technique of choice for microprocessor test and diagnostic applications. A microprocessor-based board is tested by replacing the boot ROMs on the Unit Under Test (UUT) with memory emulation pods. Each pod handles eight bits of the data bus. Processors from 8 to 32 bits can be controlled with one to four pods (even the most advanced CPUs such as the Intel Pentium generally use only an eight-bit boot path). The emulator takes control of the UUT by resetting the processor and, under the test program’s control (monitor program), exercises all functions on the board. Synchronization with the UUT is automatic and requires no additional hardware or connections.
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DSA -
Crystal instruments
It is difficult to imagine the actual vibration level and distribution from the numerical display or the signals which are basically a mathematical representation of the vibration experienced by the structure under test. Animating the structure’s deformation helps to get a better picture of the intensity of vibration. A contour scale which graphically displays the magnitude of vibration on the structure using a color plot helps in visualizing which areas of the test unit is experiencing maximum and minimum magnitude of the vibrations.
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Crystal instruments
It is difficult to imagine the actual vibration level and distribution from the numerical display or signals, which are basically a mathematical representation of the vibration experienced by the structure under test. Animating the structure’s deformation provides users with a clearer representation of the intensity from vibration. A contour scale which graphically displays the magnitude of vibration on the structure using a color plot aids in visualizing the areas a test unit is the experiencing the maximum and minimum magnitude of the vibrations.
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EE301-ISOL -
Executive Engineering
The EE301-ISOLATOR will completely isolate your electronic loads inputs & outputs signals plus ground returns from the main power input UUT (unit under test)... The module allows you to control the electronic load just as you would with any standard control signal. Input / Output & Power signals are fully isolated up to 350 VDC.
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Prober Adjustable Family -
Test Electronics
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Prober Edge Press Family -
Test Electronics
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Prober Press Rods Family -
Test Electronics
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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ScanExpress Runner Gang -
Corelis, Inc.
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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6565 SERIES -
Wayne Kerr Electronics, Ltd.
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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Acery Technologies
The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.
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ProfLine Series -
Teseq AG
The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).
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34904A -
Keysight Technologies
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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PS48402 -
APPLICOS
The PS48402 is a dual-channel Programmable DC Power supply in a single-slot 3u PXI / cPCI form factor. Each output is fully isolated and capable of providing 0 - 48V DC / 2 A / 80 W per channel. Both current and voltage are programmable and readable with 16-bit resolution. This makes the PS48402 a very cost- and rackspace-effective solution to power your dual-rail unit under test.